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Search for Near Field Probes
118 results were found
Sets
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LF1 set, Near-Field Probes 100 kHz up to 50 MHz
The LF1 near-field probe set consists of four shielded near-field probes for measuring emissions of longwave, medium wave, and shortwave frequencies on electronic devices during the development process. The probe heads of the LF1 set are designed for the incremental detection of electromagnetic int…
- PCB Emission
- Near-Field Probes
- LF, Passive, 100 kHz up to 50 MHz
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RF1 set, Near-Field Probes 30 MHz up to 3 GHz
The RF1 near-field probe set consists of four passive near-field probes for measuring E-fields and magnetic fields from 30 MHz to 3 GHz on electronic assemblies during the development stage. The different probe heads of the RF1 set allow for measurements very close to the electronic assemblies, e.g.…
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
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RF2 set, Near-Field Probes 30 MHz up to 3 GHz
The RF2 near-field probe set consists of four passive near-field probes for measuring magnetic fields from 30 MHz to 3 GHz on electronic assemblies during the development stage. The probe heads of the RF2 set allow for the step by step localization of RF magnetic-field interference sources on assemb…
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
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XF1 set, Near-Field Probes 30 MHz up to 6 GHz
The XF1 set consists of four magnetic field probes and one E-field probe for measuring E-fields and magnetic fields from 30 MHz to 6 GHz on electronic assemblies during the development stage. Due to their integrated impedance matching, the probes are less sensitive in the lower frequency range than …
- PCB Emission
- Near-Field Probes
- XF, Passive, 30 MHz up to 6 GHz
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SX1 set, Near-Field Probes 1 GHz up to 10 GHz
The SX1 set consists of three passive near-field probes for measuring E-fields and magnetic fields with a high clock frequency from 1 GHz to 10 GHz on electronic assemblies and ICs during the development stage. The different probe heads of the SX1 set allow for measurements very close to the electro…
- PCB Emission
- Near-Field Probes
- SX, Passive, 1GHz up to 20 GHz
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RF3 mini set, Near-Field Probes 30 MHz up to 3 GHz
The RF3 mini set consists of two passive near-field probes with a resolution under 1 millimeter for measuring magnetic fields between 30 MHz and 3 GHz on electronic assemblies during the development stage. The probes have special miniature heads which are designed for detailed measurements of magnet…
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- IC Security
- Side-channel analysis
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RF4-E set, Near-Field Probes E-field 30 MHz up to 3 GHz
The RF4-E probe set contains two passive E field probes to measure electrical fields with a frequency range from 30 MHz up to 3 GHz for comparison purposes. The probes are designed for the analysis of E field distributions, detection of coupling mechanisms on modules and evaluation of switching edg…
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
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ICR 03 set, Near-Field Microprobes Set
The ICR 03 set contains three of our ICR near-field microprobes (magnetic or E field) of your choice. The probes are used to measure magnetic or electric near fields with extremely high resolution and sensitivity. Optimal is a distance of < 1 mm to the measuring object. The probe head is equipped wi…
- IC Security
- Side-channel analysis
- PCB Emission
- Near-Field Microprobes
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EMC-Basic 2 set, Demonstration Boards Near-Field Probes
The SA 11 and SA 21 demonstration boards are assemblies for displaying emission phenomena. These boards allow demonstrations of various EMC measurement devices such as spectrum analyzers and near-field probes from all manufacturers. Similarly, emission measurements with antennas are possible. With …
- Equipment for Teaching and Training
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HR1 set, Near-Field Probes up to 40 GHz
The HR1 set contains one E-field probe HR-E 40-1 and one magnetic field probe HR-R 8-1 each for the development-accompanying measurement of magnetic and electric field in the frequency range up to 40 GHz.
- PCB Emission
- Near-Field Probes
- HR, Passive, up to 40 GHz
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RF Basic set, Basic set of near-field probes 30 MHz to 3 GHz
The Basic set Near-Field Probes 30 MHz to 3 GHz includes six passive near-field probes for development-related measurements of electric and magnetic fields in the frequency range of 30 MHz to 3 GHz on electronic assemblies. The various probe heads of the set enable step-by-step localization of RF em…
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
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FLS 106 PCB set, PCB Scanner, 3-Axis Positioning System
The FLS 106 PCB Langer scanner is a 3-axes positioning system used in conjunction with near-field probes in order to measure magnetic or E-fields or to pulse the device under test via H-field sources. The near-field probes or field sources can be moved along all three axes above the assembly. A dig…
- Positioning Systems
- Langer Scanner
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FLS 106 IC set, IC Scanner 4-Axis Positioning System
The FLS 106 IC scanner is a 4-axes positioning system that allows for the movement of ICR near-field probes along three linear axes and the rotation of the ICR near-field probes on one axis above an IC in its electronic assembly. The ICR near-field probes allow for the measurement of high-frequency…
- Positioning Systems
- Langer Scanner
- IC Security
- Positioning systems
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MFA 01 set, Micro Probes 1 MHz up to 6 GHz
The MFA 01 set includes high-resolution near-field micro probes used to measure magnetic fields up to 6 GHz, e.g. at signal conductors (150 µm), SMD components (0603-0201), or IC pins. Each hand-guided MFA near-field micro probe has an integrated preamplifier. The amplifier stage (9 V, 100 mA) is po…
- PCB Emission
- Near-Field Probes
- MFA, Active, 1MHz up to 6 GHz
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RFS set, Scanner Probes 30 MHz up to 3 GHz
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field.
- Positioning Systems
- Near-field Scanner Probes
- RFS, Passive, 30 MHz up to 3 GHz
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PA 203 BNC set, Preamplifier 100 kHz up to 3 GHz
The PA 203 BNC preamplifier is designed for the amplification of measuring signals, e.g. weak signals of near-field probes with high resolution. The PA 203 is connected to the 50 ohm input of a spectrum analyzer or an oscilloscope and is supplied by the wall-plug transformer. With the correct cable…
- PCB Emission
- Preamplifier
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PA 203 SMA set, Preamplifier 100 kHz up to 3 GHz
The PA 203 preamplifier is designed for the amplification of measuring signals, e.g. weak signals of near-field probes with high resolution. The PA 203 is connected to the 50 ohm input of a spectrum analyzer or an oscilloscope and is powered by the wall-plug transformer. With the correct cable, a ne…
- PCB Emission
- Preamplifier
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PA 303 BNC set, Preamplifier 100 kHz up to 3 GHz
The PA 303 BNC preamplifier is designed for the amplification of measuring signals, e.g. weak signals of near-field probes with high resolution. The PA 303 is connected to the 50 ohm input of a spectrum analyzer or an oscilloscope and is powered by the wall-plug transformer. With the correct cable a…
- PCB Emission
- Preamplifier
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PA 303 SMA set, Preamplifier 100 kHz up to 3 GHz
The PA 303 SMA preamplifier is designed for the amplification of measuring signals, e.g. weak signals of near-field probes with high resolution. The PA 303 is connected to the 50 ohm input of a spectrum analyzer or an oscilloscope and is powered by the wall-plug transformer. With the correct cable a…
- PCB Emission
- Preamplifier
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PA 303 N set, Preamplifier 100 kHz up to 3 GHz
The PA 303 N preamplifier was designed for the amplification of measuring signals, e.g. weak signals of near-field probes with high resolution. The PA 303 N is to be used with the 50 ohm input of a spectrum analyzer or an oscilloscope and is powered by the wall-plug transformer. With the correct cab…
- PCB Emission
- Preamplifier
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D10 set, EMC Demonstration Board
The D10 set is designed for demonstrations of products developed by Langer EMV-Technik GmbH. It is used for further training of distributors. The demonstration board is a PC board with different components. These generate high frequent fields which can be used to demonstrate the function of near fie…
- Equipment for Teaching and Training
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MFA 02 set, Micro Probes 1 MHz up to 1 GHz
The MFA 02 set includes two high-resolution near-field micro probes used to measure low-frequency magnetic fields up to 1 GHz, e.g. at signal conductors (150 µm), SMD components (0603-0201) or IC pins. Each hand-guided MFA near-field micro probe has an integrated preamplifier. The amplifier stage (9…
- PCB Emission
- Near-Field Probes
- MFA, Active, 1MHz up to 6 GHz
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ICR HH500-6 set, Near-Field Microprobe 2 MHz - 6 GHz
The probe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is horizontally aligned to t…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
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ICR HH500-75 set, Near-Field Microprobe 200 kHz - 1 GHz
The probe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is horizontally aligned to t…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
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ICR HH250-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is horizonta…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
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ICR HH250-75 set, Near-Field Microprobe 0.5 MHz - 2 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is horizonta…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
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ICR HH150-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is horizonta…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
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ICR HH150-27 set, Near-Field Microprobe 1.5 MHz - 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is horizonta…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
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ICR HH100-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is horizonta…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
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ICR HV100-27 set, Near-Field Microprobe 1.5 MHz - 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is verticall…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
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ICR HV100-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is verticall…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
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ICR HV150-27 set, Near-Field Microprobe 1.5 MHz - 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is verticall…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
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ICR HV150-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is verticall…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
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ICR HV250-75 set, Near-Field Microprobe 0.5 MHz - 2 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is verticall…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
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ICR HV250-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is verticall…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
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ICR HV500-75 set, Near-Field Microprobe 200 kHz - 1 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is verticall…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
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ICR HV500-6 set, Near-Field Microprobe 2 MHz - 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is verticall…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
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ICR E150 set, Near-Field Microprobe E-field 7 MHz up to 3 GHz
The near-field microprobe is designed for a high-resolution measurement of electrical near fields. With the ICR E probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring electrode at the ICR RF probe head is hori…
- IC Security
- Side-channel analysis
- PCB Emission
- Near-Field Microprobes
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ICR HH100-27 set, Near-Field Microprobe 1.5 MHz - 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring coil at the ICR RF probe head is horizonta…
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
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PA 306 SMA set, Preamplifier 100 kHz up to 6 GHz
The PA 306 SMA serves for amplifying measurement signals, for example weak signals from high-resolution near-field probes. The PA 306 is connected to the 50 Ω input of a spectrum analyzer or oscilloscope and supplied via the plug-in power supply unit included in delivery.
- PCB Emission
- Preamplifier
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DB 20 set, Demo Board 20
The Demo Boards of the DB 20 set are for the demonstration of immunity and interference emission phenomena. The Demo Boards are designed for demonstrations of various EMC measurement devices such as spectrum analyzers and near-field probes, but also ESD and burst generators of all manufacturers. Int…
- Equipment for Teaching and Training
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PA 3010 set, Preamplifier 10 MHz up to 10 GHz
The PA 3010 preamplifier was designed for the amplification of measuring signals, e.g. weak signals of near-field probes with high resolution. The PA 3010 is to be used with the 50 ohm input of a spectrum analyzer or an oscilloscope and is powered by the plug-in power supply. With the correct cable …
- PCB Emission
- Preamplifier
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PA 2522 set, Preamplifier 10 MHz up to 22 GHz
The PA 2522 preamplifier was designed for the amplification of measuring signals, e.g. weak signals of near-field probes with high resolution. The PA 2522 is to be used with the 50 ohm input of a spectrum analyzer or an oscilloscope and is powered by the plug-in power supply. With the correct cable …
- PCB Emission
- Preamplifier
Products
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ICR Probe, Your selection from our range of near-field microprobes
You make your selection from our range of ICR near-field microprobes and specify it in your request for the ICR 03 set.
- IC Security
- Side-channel analysis
- ICR 03 set, Near-Field Microprobes Set
- PCB Emission
- Near-Field Microprobes
- ICR 03 set, Near-Field Microprobes Set
- IC Security
- Side-channel analysis
- ICR 03 set, Near-Field Microprobes Set
- PCB Emission
- Near-Field Microprobes
- ICR 03 set, Near-Field Microprobes Set
- IC Security
- Side-channel analysis
- ICR 03 set, Near-Field Microprobes Set
- PCB Emission
- Near-Field Microprobes
- ICR 03 set, Near-Field Microprobes Set
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RF-R 3-2, H-Field Probe 30 MHz up to 3 GHz
The RF-R 3-2 near-field probe is used for the high-resolution measurement of RF magnetic fields directly on an assembly e.g. in range around pins and IC cases, conducting paths, decoupling capacitor and EMC components. The RF-R 3-2 is a passive near-field probe. It has the same basic construction …
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- PCB Emission
- Measurement Technology for the Development Stage
- ESA1 set, Emission Development System
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- RF1 set, Near-Field Probes 30 MHz up to 3 GHz
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- RF Basic set, Basic set of near-field probes 30 MHz to 3 GHz
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RF-R 400-1, H-Field Probe 30 MHz up to 3 GHz
Due to its large diameter (25 mm) the RF-R 400-1 H-field probe is highly sensitive and is suitable for measurements at distances up to 10 cm around assemblies and devices. The RF-R 400-1 is a passive near-field probe. In principle it has the same structure as the probes RF-R 50-1 and RF-R 3-2. The…
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- PCB Emission
- Measurement Technology for the Development Stage
- ESA1 set, Emission Development System
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- RF2 set, Near-Field Probes 30 MHz up to 3 GHz
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- RF Basic set, Basic set of near-field probes 30 MHz to 3 GHz
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RF-E 02, E-Field Probe 30 MHz up to 1.5 GHz
The RF-E 02 near-field probe detects electrical fields that are decoupled from bus structures, larger components or supply surfaces. The electrode surface on the underside of the probe tip is approx. 2 cm x 5 cm. The probe functions best within distances of 1 cm - 2 cm from the component. The RF-E …
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- PCB Emission
- Measurement Technology for the Development Stage
- ESA1 set, Emission Development System
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- RF4-E set, Near-Field Probes E-field 30 MHz up to 3 GHz
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- RF Basic set, Basic set of near-field probes 30 MHz to 3 GHz
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RF-E 05, E-Field Probe 30 MHz up to 3 GHz
The electrode at the underside of the probe head of the RF-E 05 has a width of approx. 0.5 mm. The E-fields of clocked lines, IC pins, and smaller components are precisely located. The RF-E 05 probe was developed for Langer scanner. The RF-E 05 is a near-field probe. It has the same structure as th…
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- PCB Emission
- Measurement Technology for the Development Stage
- ESA1 set, Emission Development System
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- RF4-E set, Near-Field Probes E-field 30 MHz up to 3 GHz
- Equipment for Teaching and Training
- EMC-Basic 2 set, Demonstration Boards Near-Field Probes
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- RF Basic set, Basic set of near-field probes 30 MHz to 3 GHz
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PA 203 BNC, Preamplifier 100 kHz up to 3 GHz
The PA 203 preamplifier is designed for the amplification of measuring signals, e.g. weak signals of high-resolution near-field probes. The input and the output of PA 203 are implemented as either 50 ohm BNC (PA 203 BNC) or SMA connector (PA 203 SMA).
- PCB Emission
- Measurement Technology for the Development Stage
- ESA1 set, Emission Development System
- PCB Emission
- Preamplifier
- PA 203 BNC set, Preamplifier 100 kHz up to 3 GHz
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PA 203 SMA, Preamplifier 100 kHz up to 3 GHz
The PA 203 SMA preamplifier is designed for the amplification of measuring signals, e.g. weak signals of near-field probes with high resolution. For the input and the output of the PA 203 are either a 50 ohm BNC (PA 203 BNC) or SMA connector (PA 203 SMA) is used.
- PCB Emission
- Preamplifier
- PA 203 SMA set, Preamplifier 100 kHz up to 3 GHz
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PA 303 BNC, Preamplifier 100 kHz up to 3 GHz
The PA 303 BNC preamplifier is designed for the amplification of measuring signals, e.g. weak signals of near-field probes with high resolution. The input and the output of PA 303 are implemented either as 50 ohm BNC (PA 303 BNC) or SMA connector (PA 303 SMA).
- PCB Emission
- Preamplifier
- PA 303 BNC set, Preamplifier 100 kHz up to 3 GHz
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PA 303 SMA, Preamplifier 100 kHz up to 3 GHz
The PA 303 SMA preamplifier is designed for the amplification of measuring signals, e.g. weak signals of near-field probes with high resolution. The input and the output of PA 203 use either a 50 ohm BNC (PA 303 BNC) or SMA connector (PA 303 SMA).
- PCB Emission
- Preamplifier
- PA 303 SMA set, Preamplifier 100 kHz up to 3 GHz
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PA 303 N, Preamplifier 100 kHz up to 3 GHz
The PA 303 N preamplifier is designed for the amplification of measuring signals, e.g. weak signals of near-field probes with high resolution. The input and the output of PA 303 are implemented either as 50 ohm BNC (PA 303 BNC) or SMA connector (PA 303 SMA).
- PCB Emission
- Preamplifier
- PA 303 N set, Preamplifier 100 kHz up to 3 GHz
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BT 706, Bias Tee for Langer probes
The bias tee is used for the power supply of active near-field probes of the Langer EMV-Technik GmbH, e.g. MFA or ICR. The bias tee is inserted into the signal path between the active near-field probe and the spectrum analyzer or oscilloscope and powered by a plug-in power supply.
- PCB Emission
- Near-Field Probes
- MFA, Active, 1MHz up to 6 GHz
- MFA 01 set, Micro Probes 1 MHz up to 6 GHz
- PCB Emission
- Near-Field Probes
- MFA, Active, 1MHz up to 6 GHz
- MFA 02 set, Micro Probes 1 MHz up to 1 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH500-6 set, Near-Field Microprobe 2 MHz - 6 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH500-6 set, Near-Field Microprobe 2 MHz - 6 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH500-75 set, Near-Field Microprobe 200 kHz - 1 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH500-75 set, Near-Field Microprobe 200 kHz - 1 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH250-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH250-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH250-75 set, Near-Field Microprobe 0.5 MHz - 2 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH250-75 set, Near-Field Microprobe 0.5 MHz - 2 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH150-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH150-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH150-27 set, Near-Field Microprobe 1.5 MHz - 6 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH150-27 set, Near-Field Microprobe 1.5 MHz - 6 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH100-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH100-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV100-27 set, Near-Field Microprobe 1.5 MHz - 6 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV100-27 set, Near-Field Microprobe 1.5 MHz - 6 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV100-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV100-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV150-27 set, Near-Field Microprobe 1.5 MHz - 6 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV150-27 set, Near-Field Microprobe 1.5 MHz - 6 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV150-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV150-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV250-75 set, Near-Field Microprobe 0.5 MHz - 2 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV250-75 set, Near-Field Microprobe 0.5 MHz - 2 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV250-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV250-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV500-75 set, Near-Field Microprobe 200 kHz - 1 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV500-75 set, Near-Field Microprobe 200 kHz - 1 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV500-6 set, Near-Field Microprobe 2 MHz - 6 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field
- ICR HV500-6 set, Near-Field Microprobe 2 MHz - 6 GHz
- IC Security
- Side-channel analysis
- ICR E150 set, Near-Field Microprobe E-field 7 MHz up to 3 GHz
- PCB Emission
- Near-Field Microprobes
- ICR E150 set, Near-Field Microprobe E-field 7 MHz up to 3 GHz
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH100-27 set, Near-Field Microprobe 1.5 MHz - 6 GHz
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
- ICR HH100-27 set, Near-Field Microprobe 1.5 MHz - 6 GHz
- IC Security
- Side-channel analysis
- ICR 03 set, Near-Field Microprobes Set
- PCB Emission
- Near-Field Microprobes
- ICR 03 set, Near-Field Microprobes Set
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SMB-BNC 1 m, SMB-BNC Measurement Cable
The "SMB-BNC 1 m" measuring cable is a RG174 RF cable with coaxial construction. The wave impedance is 50 ohm. The measuring cable is highly flexible and therefore specially suitable for measurements with near-field probes.
- PCB Emission
- Near-Field Probes
- LF, Passive, 100 kHz up to 50 MHz
- LF1 set, Near-Field Probes 100 kHz up to 50 MHz
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- RF1 set, Near-Field Probes 30 MHz up to 3 GHz
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- RF2 set, Near-Field Probes 30 MHz up to 3 GHz
- PCB Emission
- Measurement Technology for the Development Stage
- NNB 21 set, Line Impedance Stabilisation Network
- PCB Emission
- Measurement Technology for the Development Stage
- HFW 21 set, RF Current Transformer 100 kHz up to 1 GHz
- PCB Immunity
- Mini Burst Field Generators
- P12t set, Mini Burst Field Generator (B, Trigger)
- PCB Immunity
- Mini Burst Field Generators
- P11t set, Mini Burst Field Generator (B, Trigger)
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- RF3 mini set, Near-Field Probes 30 MHz up to 3 GHz
- IC Security
- Side-channel analysis
- RF3 mini set, Near-Field Probes 30 MHz up to 3 GHz
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- RF4-E set, Near-Field Probes E-field 30 MHz up to 3 GHz
- Equipment for Teaching and Training
- EMC-Basic 2 set, Demonstration Boards Near-Field Probes
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
- RF Basic set, Basic set of near-field probes 30 MHz to 3 GHz
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SH 01, Probe Holder for Langer scanner
The probe holder is used to hold near field probes of Langer EMV-Technik GmbH. The probe holder supports the function collision protection system of the Langer-Scanner. The probe holder is attached to the rotating unit of Langer-Scanner.
- Positioning Systems
- Accessories for Langer Scanner
- Positioning Systems
- Langer Scanner
- FLS 106 PCB set, PCB Scanner, 3-Axis Positioning System
- Positioning Systems
- Langer Scanner
- ICS 105 set, IC Scanner 4-Axis Positioning System
- IC Security
- Positioning systems
- ICS 105 set, IC Scanner 4-Axis Positioning System
- Positioning Systems
- Langer Scanner
- FLS 106 IC set, IC Scanner 4-Axis Positioning System
- IC Security
- Positioning systems
- FLS 106 IC set, IC Scanner 4-Axis Positioning System
- Positioning Systems
- Langer Scanner
- FLS 106 PCB basic set, PCB Scanner, 3-Axis Positioning System without CS-Scanner Software
- Positioning Systems
- Langer Scanner
- FLS 106 IC basic set, IC Scanner 4-Axis Positioning System without CS-Scanner Software
- Positioning Systems
- Langer Scanner
- ICS 105 basic set, IC Scanner 4-Axis Positioning System without CS-Scanner Software
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DM-CAM, Digital Microscope Camera
The digital microscope camera is an essential part of a Langer-Scanner and makes it easier to position the near-field probes above the DUT.
- IC Test System
- IC Test Environment
- ICE1 set, IC Test Environment
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D10, Demonstration Board
The demonstration board is a PC board with different components. These generate high frequent fields which can be used to demonstrate the function of near field probes developed by Langer EMV-Technik GmbH. The interference effect of generators and field sources developed by Langer EMV-Technik GmbH …
- Equipment for Teaching and Training
- D10 set, EMC Demonstration Board
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PA 306 SMA, Preamplifier 100 kHz up to 6 GHz
The PA 306 serves for amplifying weak measurement signals, for example from near-field probes or antennas. It is distinguished by its low noise output and high dynamic scope over a wide frequency range.
- PCB Emission
- Preamplifier
- PA 306 SMA set, Preamplifier 100 kHz up to 6 GHz
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ICEM Scan, Measurement Service for IC Emission with Stripline acc. to IEC/TS 61967-3
The ICEM Scan measurement service determines the near-field electrical or magnetical components on or near the surface of an IC in accordance with the IEC/TS 61967-3 standard. This diagnostic procedure is used for architectural analysis of an IC such as manufacturing planning and optimization of pow…
- IC-EMC Analysis
- Emission
-
ICS 105, 4-Axis Positioning System
The ICS 105 IC scanner is a 4-axis positioning system for moving near-field probes in three linear axes and for rotating the near-field probes over an IC in an electronic PCB. The scanner is suitable for ICI injection probes, ICR near-field microprobes and all other near-field probes from Langer EM…
- Positioning Systems
- Langer Scanner
- ICS 105 set, IC Scanner 4-Axis Positioning System
- IC Security
- Positioning systems
- ICS 105 set, IC Scanner 4-Axis Positioning System
- Positioning Systems
- Langer Scanner
- ICS 105 basic set, IC Scanner 4-Axis Positioning System without CS-Scanner Software
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FLS 106 IC, 4-Axis Positioning System
The FLS 106 4-axis positioning system is used to move near field probes in four axises and to rotate the near field probes above a DUT.
- Positioning Systems
- Langer Scanner
- FLS 106 IC set, IC Scanner 4-Axis Positioning System
- IC Security
- Positioning systems
- FLS 106 IC set, IC Scanner 4-Axis Positioning System
- Positioning Systems
- Langer Scanner
- FLS 106 IC basic set, IC Scanner 4-Axis Positioning System without CS-Scanner Software
-
SF IHS, Experimental EMC In-house Seminar - Immunity 3 days
In the EMC in-house seminar on interference immunity, we offer content customized to the requirements of your company.
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FLS 106 PCB, 3-Axis Positioning System
The FLS 106 3-axis positioning system is used to move near field probes in three axises and to rotate the near field probes above a DUT.
- Positioning Systems
- Langer Scanner
- FLS 106 PCB set, PCB Scanner, 3-Axis Positioning System
- Positioning Systems
- Langer Scanner
- FLS 106 PCB basic set, PCB Scanner, 3-Axis Positioning System without CS-Scanner Software
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Parameters for IC – Why ICs are so important for the EMC of Electrical Devices
Apart from the layout and housing design, the characteristics of the ICs used play a key role for the EMC characteristics of devices. Reducing the size of the structure, operating voltages and operating points makes the ICs much more sensitive. If one approaches or even surpasses the 100 nm limit, t…
- Technical article IC-EMC
- Basic Knowledge
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New Development Tools and EMC Strategies in Step with Practical Electronics
Imagine for a moment that you are trying out a brand new car: you slide into one of the ergonomic seats, start the engine and, to make things perfect, would like to listen to some music. But when you switch this on, you suddenly notice interesting side effects. The light comes on in the passenger co…
- Technical article Board-EMC
- Emission
-
SA IHS, Experimental EMC In-house Seminar - Emission 3 days
In the EMC in-house seminar on interference emission, we offer content customized to the requirements of your company.
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From Device Testing to the IC Test System
Analyzing immunity at the IC level has the benefit of not requiring the impact of the device’s design on EMC to be considered. This includes, for example, the design of the printed circuit board, the nature and availability of the connector, or the housing construction. This article describes the co…
- Technical article IC-EMC
- Immunity
-
CM-SHP, Customized Shapes
Langer EMV-Technik GmbH also manufactures special shapes of near-field probes according to customer requirements. Here are some examples.
- PCB Emission
- Near-Field Probes
-
SA 11, Demo Board Emission B-field
The SA 11 demo board is a board on which demonstration experiments for magnetic field for interference emission are performed. A spectrum analyzer is used to display the measurement results. The SA 11 can be used to demonstrate antennas, near-field probes, the ESA1 interference emission development …
- Equipment for Teaching and Training
- DB 20 set, Demo Board 20
- Equipment for Teaching and Training
- EMC-Basic 2 set, Demonstration Boards Near-Field Probes
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SA 21, Demo Board Emission E-field
The SA 21 demo board is a board on which demonstration experiments for electric field for interference emission are performed. A spectrum analyzer is used to display the measurement results. The SA 21 can be used to demonstrate antennas, near-field probes, the ESA1 interference emission development …
- Equipment for Teaching and Training
- DB 20 set, Demo Board 20
- Equipment for Teaching and Training
- EMC-Basic 2 set, Demonstration Boards Near-Field Probes
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PA 3010, Preamplifier 10 MHz up to 10 GHz
The PA 3010 preamplifier is used to amplify weak measurement signals, e.g. from near-field probes. It is characterized by low noise behavior and a constantly high dynamic range over a wide frequency range.
- PCB Emission
- Preamplifier
- PA 3010 set, Preamplifier 10 MHz up to 10 GHz
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PA 2522, Preamplifier 10 MHz up to 22 GHz
The PA 2522 preamplifier is used to amplify weak measurement signals, e.g. from near-field probes. It is characterized by low noise behavior and a constantly high dynamic range over a very wide frequency range.
- PCB Emission
- Preamplifier
- PA 2522 set, Preamplifier 10 MHz up to 22 GHz
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ICS DM-CAM, Digital Microscope Camera
The digital microscope camera is an essential part of a Langer-Scanner and makes it easier to position the near-field probes above the DUT.
- Positioning Systems
- Langer Scanner
- ICS 105 set, IC Scanner 4-Axis Positioning System
- IC Security
- Positioning systems
- ICS 105 set, IC Scanner 4-Axis Positioning System
- Positioning Systems
- Langer Scanner
- ICS 105 basic set, IC Scanner 4-Axis Positioning System without CS-Scanner Software
-
FLS DM-CAM, Digital Microscope Camera
The digital microscope camera is an essential part of a Langer-Scanner and makes it easier to position the near-field probes above the DUT.
- Positioning Systems
- Langer Scanner
- FLS 106 PCB set, PCB Scanner, 3-Axis Positioning System
- Positioning Systems
- Langer Scanner
- FLS 106 IC set, IC Scanner 4-Axis Positioning System
- IC Security
- Positioning systems
- FLS 106 IC set, IC Scanner 4-Axis Positioning System
- Positioning Systems
- Langer Scanner
- FLS 106 PCB basic set, PCB Scanner, 3-Axis Positioning System without CS-Scanner Software
- Positioning Systems
- Langer Scanner
- FLS 106 IC basic set, IC Scanner 4-Axis Positioning System without CS-Scanner Software
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Langer Near-field Probes in R&D worldwide
In the following you will find a selection of R&D publications and papers on Langer EMV-Technik measurement instruments form all over the world.
- Langer Near-field Probes in R&D worldwide
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EMC Interference Suppression with Near-Field Probes & Spectrum Analyzer Software ChipScan-ESA pt1
This video shows how to localize EMC interference suppression with near-field probes and how to display, record and compare the measured results with the spectrum analyzer software ChipScan-ESA. 5:25 min
- EMC Know-How
- Videos
- EMC Webinar
- EMC Interference Suppression with Near-Field Probes & Spectrum Analyzer Software ChipScan-ESA pt1
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EMC Interference Suppression with Near-Field Probes & Spectrum Analyzer Software ChipScan-ESA pt2
This video shows how to localize EMC interference suppression with near-field probes and how to display, record and compare the measured results with the spectrum analyzer software ChipScan-ESA. 8:44 min
- EMC Know-How
- Videos
- EMC Webinar
- EMC Interference Suppression with Near-Field Probes & Spectrum Analyzer Software ChipScan-ESA pt2
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Measurement Technology for IC Security: Langer Near-Field Probes in Practical Use
For side-channel analysis, near-field probes can be used to examine electromagnetic emissions in the near field.
- EMC Know-How
- Newsletter
- Measurement Technology for IC Security: Langer Near-Field Probes in Practical Use
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Milestones
Langer EMV-Technik GmbH develops measuring devices for accompanying EMV-analysis during the assembly development (PCB) and IC development (IC)
- About us
- Company
- Milestones
-
Trade Fair Participation
Langer EMC-Technik GmbH participates globally in trade fairs and conferences
- Trade Fair Participation
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01 MFA micro probes and LVDS suppression
MFA and ChipScan-ESA for measuring emitted interference of the common mode currents
- EMC Know-How
- Newsletter
- 01 MFA micro probes and LVDS suppression
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02 XF sniffer probes and LVDS suppression
Interference suppression of LVDS connections with near-field probes
- EMC Know-How
- Newsletter
- 02 XF sniffer probes and LVDS suppression
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04 Radiated Emissions at the PCB Level - An Introduction
Identifying EMI interference sources with near-field probes on the PCB
- EMC Know-How
- Newsletter
- 04 Radiated Emissions at the PCB Level - An Introduction
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05 Time and cost savings when recording and documenting RF measurements with a spectrum analyzer
Software secures and documents numerous EMC measurements
- EMC Know-How
- Newsletter
- 05 Time and cost savings when recording and documenting RF measurements with a spectrum analyzer
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07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
Using the IC measurement technology of the Langer EMV-Technik GmbH for precompliant testing of the electromagnetic compatibility of integrated circuits and allocation of the testing systems to the (international) standards.
- EMC Know-How
- Newsletter
- 07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
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ICS 105 - Set-up of scanner and probes
This tutorial shows how to set up the Langer Scanner ICS 105 and how to install the different types of probes for near-field EMC measurement. It also explains how to use the Software ChipScan-Scanner.
- ICS 105 - Set-up of scanner and probes
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08 ESD and Efficient Electronic Design
This article focuses on the impact of IC behavior on electronic design, specifically ESD characteristics and how they influence a device by influencing its ICs.
- EMC Know-How
- Newsletter
- 08 ESD and Efficient Electronic Design
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09 Surface Scan on IC Level with high Resolution
This article focuses on measurements with E-field and H-field microprobes.
- EMC Know-How
- Newsletter
- 09 Surface Scan on IC Level with high Resolution
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11 ChipSan-ESA now supports more measuring devices
- EMC Know-How
- Newsletter
- 11 ChipSan-ESA now supports more measuring devices
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12 ICR: Near-field analysis in the micrometer range and its advantages
Using the example of an investigation on the "Raspberry Pi"
- EMC Know-How
- Newsletter
- 12 ICR: Near-field analysis in the micrometer range and its advantages
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17 ESA1 set
ESA1 set – Application example: Troubleshooting emission problems on electronics
- EMC Know-How
- Newsletter
- 17 ESA1 set
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IC EMC Parameters - Mechanisms of Interference Emission
The article shows how new IC test methods and defined IC parameters help identify emission risks early and optimize assemblies in a targeted way.
- EMC Know-How
- Newsletter
- IC EMC Parameters - Mechanisms of Interference Emission
Information
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Near-Field Probes
Near-field probes are used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices. Technical parameters for the single probes are available from the respective product articles and from the overview PDF as a download.
- Products
- PCB Emission
- Near-Field Probes
-
Near-field Scanner Probes
Passive near-field probes designed for the use in a scanner to measure E-field and magnetic field during development.
- Products
- Positioning Systems
- Near-field Scanner Probes
-
Near-Field Microprobes
The near-field microprobes (ICR) can be used for E-field and H-field measurements in a frequency range from 0.5 MHz to 6 GHz with a resolution from 60 µm to 300 µm.
- Products
- PCB Emission
- Near-Field Microprobes
-
Positioning Systems
Positioning systems (scanner) for all Langer Near-Field Probes, Langer Injection Probes (ICI and ICI-DP) and Near-Field Microprobes (ICR).
- Products
- Positioning Systems
-
Near-Field Microprobe Sets ICR HH H Field
The ICR HH set contains one ICR near-field microprobe for magnetic field measurement. The measuring coil is horizontal in the probe head. The ICR probes are operated with a positioning system (Langer Scanner).
- Products
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HH H Field
-
MFA, Active, 1MHz up to 6 GHz
The MFA family consists of four active magnetic field probes. The MFA 01 includes three magnetic field probes. The MFA 02 set consists of two magnetic field probes for low frequency measurements.
- Products
- PCB Emission
- Near-Field Probes
- MFA, Active, 1MHz up to 6 GHz
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XF, Passive, 30 MHz up to 6 GHz
The XF family consists of four magnetic-field probes and three E-field probes. The XF1 set (four magnetic-field probes and one E-field probe) as well as customized sets are available.
- Products
- PCB Emission
- Near-Field Probes
- XF, Passive, 30 MHz up to 6 GHz
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RF, Passive, 30 MHz up to 3 GHz
The RF family consists of nine magnetic field probes and six E-field probes, which are available in sets. These sets are optimized for different measurement tasks. We are happy to create customized sets upon request.
- Products
- PCB Emission
- Near-Field Probes
- RF, Passive, 30 MHz up to 3 GHz
-
LF, Passive, 100 kHz up to 50 MHz
The LF family consists of seven magnetic-field probes, four of which are included in our LF1 probe set. We are happy to create customized sets upon request.
- Products
- PCB Emission
- Near-Field Probes
- LF, Passive, 100 kHz up to 50 MHz
-
Near-Field Microprobe Sets ICR HV H Field
The ICR HV set contains one ICR near-field microprobe for magnetic field measurement. The measuring coil is vertical in the probe head. The ICR probes are operated with a positioning system (Langer Scanner).
- Products
- IC Security
- Side-channel analysis
- Near-Field Microprobe Sets ICR HV H Field
-
Side-channel analysis
The near-field microprobes can be used for E- and H-field measurements during development in the frequency range from 0.5 MHz to 6 GHz with a resolution of 60 µm to 300 µm.
- Products
- IC Security
- Side-channel analysis
-
Side-channel analysis
Near-Field probes & microprobes for side-channel analysis. The probes permit the measurement of E- & H-fields in a frequency range from 0.5 MHz to 6 GHz and a spatial resolution up to 60 µm.
- Side-channel analysis
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Positioning systems
Automated positioning solutions (IC scanners) for IC injection probes (ICI and ICI-DP) and near-field microprobes (ICR) from Langer EMV-Technik GmbH.
- Products
- IC Security
- Positioning systems
-
Near-Field Microprobe Sets ICR HH H Field
The ICR HH set contains one ICR near-field microprobe for magnetic field measurement. The measuring coil is horizontal in the probe head. The ICR probes are operated with a positioning system (Langer Scanner).
- Products
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HH H Field
-
Near-Field Microprobe Sets ICR HV H Field
The ICR HV set contains one ICR near-field microprobe for magnetic field measurement. The measuring coil is vertical in the probe head. The ICR probes are operated with a positioning system (Langer Scanner).
- Products
- PCB Emission
- Near-Field Microprobes
- Near-Field Microprobe Sets ICR HV H Field