Milestones

Langer EMV-Technik GmbH develops measuring devices for accompanying EMV-analysis during the assembly development (PCB) and IC development (IC)

2015
Development of the IC Tester ICT1
2015
Extension of frequency up to 10 GHz of the near-field probe group
2012
Extension of the analog measurement system A300 up to a range of 5 MHz
2010
Extension of frequency up to 6 GHz of the near-field probe group
2009
Company certification as supporter of further education
2008
Launch of ESD-field sources for IC-Test
2008
Development of new ICR near-field microprobes for IC scanner up to 6 GHz with an inner diameter of 100 µm
2007
Launch of the IC scanners with ChipScan-Scanner software
2006
Extension of the analog measurement system A200 up to a range of 500 kHz
2005
Launch of ICR near field microprobes with an inner diameter of 150 µm
2003
Introduction of EMV IC Test-system for RF-compliant current and voltage measurements and Burst current and Burst voltage supply in separate pins.
2002
Launch of development system emitted interference ESA1
2001
Research on emitted interference problems of automotive electronics
2000
Production of the first analog measuring systems A100
1998
X Magnetic field sources and E-field sources for Burst generators according to EN 61000-4-4, launch of the first RF near-field probes
1997
Development of the first digital optical measuring systems OSE
1996
Launch of development system interference immunity E1
1994
Research for technological protection of assemblies against burst disturbance
1993
Start of industry EMC consulting
1980
basic EMC research (18 patents and utility models / 4 European registrations)