IC Test System
With the IC (integrated circuit) test system the developer tests the behavior of circuits during specific disturbances (conducted and radiated) or their emissions. The IC is tested in operation.
IC Test Environment
With the IC Test Environment, you can determine EMC parameters of an IC and assess the EMC strength of ICs.
The IC probes for emission allow for conducted RF measurements and measurements of RF field emission.
Measuring systems for the coupling of Burst, EFT, ESD and RF are available for conducted and radiated measurements of an IC`s immunity.
IC Side Channel Analysis
These probes allow for inject fast, transient magnetic field, E-field and current pulses into ICs.
The simulation models of our probes help to understand and combine EMC measurement and simulation.