ICEM 150-1

IC Emission Measurement 150/1 Ohm Method acc. IEC 61967-4

Using P603 and P750 for emission measurement every single IC pin/BGA is separately contacted and measured. The measurement meets the 150/1 Ohm method according to IEC 61967-4. The Langer-Technik GmbH`s measurements setups normally include interconnected shunts and voltage dividers at the pin in the …

ICEM Scan

IC Emission Measurement Surface Scan Method acc. IEC 61967-3

ICEM SL

IC Emission Measurement Stripline acc. IEC 61967-8

ICEM TEM

IC Emission Measurement acc. TEM Cell Method IEC 61967-2