ICEM 150-1

IC Emission Measurement 150/1 Ohm Method acc. IEC 61967-4

Measurement of conducted emissions - Measurement with direct 1 Ohm/150 Ohm coupling (IEC 61967-4) in the frequency range 150 kHz - 3 GHz The IEC 61967-4 standard specifies a method for measuring the conducted electromagnetic emission (EME) of ICs by directly measuring the radio frequency (RF) curre…

ICEM Field

IC Emission Measurement Field Coupled Analysis

The RF field decoupling measurement uses separate magnetic and E-field probes to measure the respective near fields decoupled by an IC in its function. It is a further investigation to the tests according to IEC 61967 (TEM or IC stripline). The measurement results help the developer to be able to gi…

ICEM Scan

IC Emission Measurement Surface Scan Method acc. IEC 61967-3

The IEC 61967-3 standard provides a test method that specifies the near-field electrical or magnetic components on or near the surface of an IC. This diagnostic procedure is used for architectural analysis of an IC such as manufacturing planning and optimization of power distribution. This test meth…

ICEM SL

IC Emission Measurement Stripline acc. IEC 61967-8

The IEC 61967-8 standard specifies a method for measuring the electromagnetic radiation of an IC in the frequency range from 150 kHz to 3 GHz. The IC under test is mounted on an IC measurement adapter printed circuit board (PCB), which is located between the active conductor and the ground plane of …

ICEM TEM

IC Emission Measurement acc. TEM Cell Method IEC 61967-2

The IEC 61967-2 standard specifies a method for measuring the electromagnetic radiation of an IC in the frequency range from 150 kHz to 1 GHz. The IC under test is mounted on an IC measurement adapter printed circuit board (PCB), which is fixed in a suitable opening of the transverse electromagnetic…