Fault Injection
The ICI and ICI-DP probes allow for inject fast, transient magnetic or electric fields as well as current pulses into ICs. They are intended to use for electromagnetic fault injection (EMFI) or body biasing injection (BBI).
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ICI-DP HH500-15
Double Pulse Magnetic Field Source
The Double Pulse IC-Injection Probe (ICI-DP) is a pulse magnetic field source designed for EM fault injection in IC security applications.
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ICI HH500-15 L-EFT
Pulse Magnetic Field Source
The ICI HH500-15 L-EFT pulse magnetic field source couples fast transient pulses into a test IC (open die). This allows for side channel analysis or testing the immunity of individual areas of the IC.
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ICI E450 L-EFT
Pulse E-Field Source
The ICI E450 L-EFT pulse electric field source couples fast transient pulses into a test IC (open die). This allows for side channel analysis or testing the immunity of individual areas of the IC.
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ICI I900 L-EFT
Pulse Current Source (FBBI)
The ICI I900 L-EFT pulse current source couples fast transient pulses into a test IC (Forward body biased injection). This source allows for side channel analysis or testing the immunity of individual areas of the IC.
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ICI 03 L-EFT set
IC EM Pulse Injection Langer Pulse
The ICI 03 L-EFT set consists of three different ICI sources emitting electric, magnetic field and current pulses. This allows high precision and very high resolution IC analysis and body bias injection. These sources allow side channel analysis e.g. to test security-critical circuits. Special featu…