##### Fields of application

RF field measurement for E- and H-field with near-field probes and a spectrum analyzer or an oscilloscope.

##### Correcting Characteristic Curves of Magnetic Field Probes

**RF-type probes from Langer-EMV Technik GmbH **

* Magnetic field strength and current determination*

The following paragraph explains how magnetic field strength and underlying currents are calculated from the results of near-field measurements.

A magnetic field probe emits a U_{probe} voltage signal output which is dispersed into a spectrum by a spectrum analyzer. A correction factor K_{H} is defined which describes the relationship between the voltage signal and the associated magnetic field H_{RF}. The magnetic field H_{RF} is linked with a current I_{RF}. Another correction factor can, thus, be defined based on the current I_{RF}.

*Magnetic field correction:*

The magnetic field strength H_{RF} in the coil of the magnetic field probe can be calculated from the voltage output signal of the U_{probe} magnetic field probe by means of the correction characteristic. The correction factor of the magnetic field probe is independent of the measurement geometry in each individual application, i.e. the probe can be guided at an arbitrary distance and angle relative to the electric conductor without any correction error (**Figure 2**) . The result is the average magnetic field that is enclosed by the probe coil (**Figure 1**) .

Use of the correction factor K_{H} in the adapted quantity equation:

Example of how the quantity equation is used, **Figure 3**:

In **Figure 3** the magnetic field probe was located in a magnetic field that is constant over the frequency range. Due to the coupling factor the voltage which is induced in the probe depends on the frequency. The coupling factor intermediates between the measured voltage U_{probe} and the mean magnetic field strength. The existing magnetic field strength is obtained if the correction factor is added to the measured voltage U_{probe} (logarithmized quantity equation).

The mean magnetic field strength H_{RF} can be determined from the measured curve U_{probe} and the correction characteristic K_{H} using the quantity equation. The result is shown in **Figure 3**.

* Current correction:*

There is a consistent physical correlation between the magnetic field H_{RF} and the current I_{RF} which depends on the geometry of the current conductor layout. The given correction factor K_{I} thus refers to a defined reference setup.

The determined current values I_{corr} are only correct if the geometric parameters coincide with the reference setup when the probes are used. If there are deviations from this setup, the current values I_{corr} will also deviate. The calculated current value I_{corr} can only be used as an orientation value.

The reference setup has the following geometric parameters (**Figures 4 and 5**) :

- Width of the conductor run 2 mm
- Height of the conductor run above the ground system 1 mm
- Probe placed on the conductor run

Use of the correction factor K_{I} in the adapted quantity equation:

The example is based on a current that is constant over the frequency range (**Figure 6**). This current induces a voltage in the magnetic field probe which is measured as U_{probe} by the spectrum analyzer. The frequency-dependent correction factor is added (logarithmically) from the voltage waveform to obtain the current in the conductor. I_{corr} is the current in dBµA which flows in the reference setup.

##### Download Correction Characteristics

You can download the correction data for our special magnetic field probe types as xlsx-file.

And for User of our software "ChipScan" ( older versions than 3.0) please download here the correction data in fdi-format.

##### Downloads

Quality features of Langer near field probesOverview all near field probes Langer EMV-Technik GmbH