The field sources, which are included in the probe set EFT/Burst field coupling, generate electric and magnetic EFT/Burst pulse fields. With these fields, ICs are defined and reproducibly pulsed to determine their immunity against EFT/Burst pulse fields.
The reason for this is the EFT/Burst immunity of PC boards and electrical devices. The immunity is tested (IEC 61000-4-4). During the tests, electric and magnetic fields are generated by coupled EFT/Burst interference into the PC boards. These fields affect the PC board surface and penetrate the IC casings. If fields penetrate the ICs, disturbance events will be generated. The IC interference via magnetic or electrical fields is a significant source of interference path in addition to the conducted coupling of EFT/Burst interference above the ICs.
From the probe set, knowledge will be gained of the IC EMC behaviour and this can be streamlined into the development of the PC board. Expensive redesigns are avoided and development costs are reduced.
Furthermore, the use of the test methods for the determination of IC EMC parameters enables the IC producer to develop ICs more efficiently.
The test set-up needs the ICE1 test system and external devices. The field sources are powered by an EFT/Burst generator (IEC 61000-4-4). The delivery includes the HV FI-FI 1m RF cable (Fischer connector-Fischer connector). On request, the RF cable with the connections Fischer socket-SHV socket (HV FI-SHV 1m) can be ordered.
Scope of delivery
- 1x P1202-4, EFT/Burst Magnetic Field Source
- 1x P1202-4 50R, EFT/Burst Magnetic Field Source
- 1x P1302-4, EFT/Burst E-Field Source
- 1x P1302-4 50R, EFT/Burst E-Field Source
- 1x BPM 02, dB/dt Field Meter
- 1x EPM 02, dE/dt Field Meter
- 1x D70 h03, Spacer Ring, 3 mm
- 1x D70 h10, Spacer Ring, 10 mm
- 2x SMA-SMB 1 m, SMA-SMB Measuring Cable
- 1x HV FI-SHV 1 m, High-Voltage Cable Fischer-SHV
- 1x P1202-4 / P1302-4 case, System Case
- 1x P1202-4 / P1302-4 m, P1202-4 / P1302-4 Set User Manual
Scope of delivery details
The EFT/Burst magnetic field source is used to determine the IC immunity against the coupling of magnetic EFT field pulses. It is continuously rotatable through 360° and allows the detection of sensitive conductor loops within the IC and detection of conductor loops that lead out of the IC via the p…
The EFT/Burst magnetic field source is used to determine the IC immunity against the coupling of magnetic EFT pulse fields. It is continuously rotatable through 360° and allows the detection of sensitive conductor loops within the IC and detection of conductor loops that lead out of the IC via the p…
The P1302-4 EFT/Burst E field source is used to determine IC immunity against the coupling of electric EFT field pulses. It does not have an internal terminating resistor and operates in open circuit condition.
The P1302-4 50R EFT/Burst E field source is used to determine IC immunity against the coupling of electric EFT-pulse fields. It has a 50 Ohm internal terminating resistor.
The BPM 02 is a dB/dt field meter and it is used to measure the temporal change of the magnetic field strength characteristics dB/dt up to 3 GHz. The lower limit frequency depends on the measurement set-up.
The EPM 02 is suitable for the measurement of fast transients with a bandwidth up to 3 GHz. The dE/dt field meter doesn't have a lower limit frequency. Depending on the noise limit of the used measuring device the usage of the EPM 02 is limited in the lower frequency range. For example, at a noise …