The probe set is used to measure conducted emissions 1 Ohm/150 Ohm with the direct coupling method on IC pins. The S603 probe is used for current measurement and the S750 probe is used for voltage measurement.
The measurements with the S603/S750 ensure a high repeatability and comparability of the measurements. The measurements can be performed with the ChipScan-ESA software. The measurement results of all measured pins are saved with the help of the software. It allows systematically and quickly comparison and analysis of the measured data.
Scope of delivery details
The S603 probe is a 1 Ω-probe for direct measurement of high frequency (RF) current at IC pins. It is used to measure at supply pins (Vdd / Vss) and signal pins. The S603 1 Ohm RF current probe has a pin contact with which every IC pin can be separately contacted and measured
The S750 probe is a RF-Voltmeter for conducted measurement of high frequency voltage on IC pins. The S750 complies with the 150 Ω coupling network according to IEC 61967-4 up to a frequency of 3 GHz.