P301 L-EFT
Voltage Generator up to 500 V Langer Pulse 1.5/20 ns


Short description
The probe is used to couple in grip bounded pulse current into the IC to be tested. It simulates attenuated disturbance current pulses at the IC input resulting from tests according to IEC 61000-4-2 / ICE 61000-4-4. During a test, disturbance current pulses can result above the magnetic fields .