The SX-R 20-1 set consists of one passive near-field probes for measuring magnetic fields with a high clock frequency from up to 20 GHz on electronic assemblies and ICs during the development stage. The different probe heads of the SX probes allow for measurements very close to the electronic assemblies, e.g. on single IC pins, conducting paths, components, and connectors, in order to localize interference sources. An electronic assembly’s field orientation and field distribution can be detected through specific use of the near-field probe. The near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input.
Scope of delivery
|Frequency range||1 GHz ... 20 GHz|
|Probe head dimensions||≈ 6x6 mm|
|Connector - output||SMA, female, jack|
Scope of delivery details
The SX-R 20-1 is a passive H-field probe covering a frequency range up to 20 GHz. The probe head of the SX-R 20-1 is very compact. This allows the location of very small H-field sources, e.g. on traces, individual components or above an IC. It has a current attenuating sheath and, therefore, is elec…