The measurement coil of the SX-B 3-1 H-field probe is set at a 90° angle relative to the probe shaft. By positioning the probe head vertically, the measurement coil directly touches the surface of the printed circuit board. It is therefore possible to measure even hard to reach spots on the printed circuit board, e.g. between big components of switching controllers.
The SX-B 3-1 is a passive near-field probe. It detects magnetic field lines emitted orthogonally from the device. Magnetic field lines entering the probe laterally are not detected. In contrast to the SX-R 3-1 H-field probe, the coil of the SX-B 3-1 probe is positioned at a 90° angle. The near-field probe is small and handy. It has a current attenuating sheath and its upper side is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input.