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Sets

• ICS 105 set, IC Scanner 4-Axis Positioning System

  The ICS 105 IC scanner allows for measurements of high-frequency near fields above ICs. Depending on the used ICR near-field microprobe magnetic or electric fields can be measured with a measuring resolution of 50 to 100 µm. The probe can also be automatically rotated to determine the magnetic field…

  • Positioning Systems
  • Langer Scanner

  • IC Security
  • Positioning systems
  

• FLS 106 PCB basic set, PCB Scanner, 3-Axis Positioning System without CS-Scanner Software

  The FLS 106 PCB basic set is a high-precision positioning system for automated near-field measurements on [ICs / PCBs]. It enables precise probe positioning across multiple axes and supports reproducible EMC analyses with high spatial resolution. The Basic version is specifically designed for users …

  • Positioning Systems
  • Langer Scanner
  

• FLS 106 IC basic set, IC Scanner 4-Axis Positioning System without CS-Scanner Software

  The FLS 106 IC basic set is a high-precision positioning system for automated near-field measurements on [ICs / PCBs]. It enables precise probe positioning across multiple axes and supports reproducible EMC analyses with high spatial resolution. The Basic version is specifically designed for users w…

  • Positioning Systems
  • Langer Scanner
  

• ICS 105 basic set, IC Scanner 4-Axis Positioning System without CS-Scanner Software

  The ICS 105 basic set is a high-precision positioning system for automated near-field measurements on [ICs / PCBs]. It enables precise probe positioning across multiple axes and supports reproducible EMC analyses with high spatial resolution. The Basic version is specifically designed for users who …

  • Positioning Systems
  • Langer Scanner
  

• MP DPI set, Measurement Station Direct Power Injection

  The Measurement Station DPI is a test bench for conducted immunity testing of ICs in accordance with IEC 62132-4 (Direct Power Injection, DPI). The unique selling point of this system is its high degree of flexibility offered to the customer. Depending on the configuration, the Measurement Station …

  • Measuring and Calibration Stations
  • IC
  

Products

• CS-Scanner, ChipScan-Scanner Software / USB

  The ChipScan-Scanner software is used for the automated measurement of electric and magnetic near fields of electronic assemblies. The software enables measurements in a plane or in the volume above the assembly, visualization of the measurement results for fast and accurate evaluation of the near f…

  • Software

  • Positioning Systems
  • Langer Scanner
  • FLS 106 PCB set, PCB Scanner, 3-Axis Positioning System

  • Positioning Systems
  • Langer Scanner
  • ICS 105 set, IC Scanner 4-Axis Positioning System

  • IC Security
  • Positioning systems
  • ICS 105 set, IC Scanner 4-Axis Positioning System

  • Positioning Systems
  • Langer Scanner
  • FLS 106 IC set, IC Scanner 4-Axis Positioning System

  • IC Security
  • Positioning systems
  • FLS 106 IC set, IC Scanner 4-Axis Positioning System
  

• Parameters for IC – Why ICs are so important for the EMC of Electrical Devices

  Apart from the layout and housing design, the characteristics of the ICs used play a key role for the EMC characteristics of devices. Reducing the size of the structure, operating voltages and operating points makes the ICs much more sensitive. If one approaches or even surpasses the 100 nm limit, t…

  • Technical article IC-EMC
  • Basic Knowledge

• Is EMC prepared to handle the Challanges of the Internet of Things

  • Technical article IC-EMC
  • Basic Knowledge

• Immunity of Electronic Devices

  Both the integration density of integrated circuits and their internal processing speed continue to rise, which also entails a higher susceptibility in terms of EMC. Fast disturbance pulses which were not even perceived by slower ICs in the past may now lead to serious trouble. Immunity tests on ind…

  • Technical article IC-EMC
  • Immunity

• ESD – EMC Problems in the Development of Electronic Modules

  In this article you will learn about how you can save time and cost for your development by knowing ESD parameters of IC's

  • Technical article IC-EMC
  • Immunity

• ESD Suppression on Microcontrollers at Board Level

  EMC tests identify potential EMC problems encountered by microcontrollers in practice. Electrostatic discharge is an issue of particular concern for circuits that include microcontrollers.

  • Technical article Board-EMC
  • Immunity

• Questions on EMC - Competent Advice from the very Start of Development saves Costs and Time in the long Run

  The demands have grown on EMC know-how in modern product development. ICs today are much more sensitive and the number of EMC standards and directives which have to be complied with has risen too.

  • Technical article Board-EMC
  • Basic Knowledge

• New Development Tools and EMC Strategies in Step with Practical Electronics

  Imagine for a moment that you are trying out a brand new car: you slide into one of the ergonomic seats, start the engine and, to make things perfect, would like to listen to some music. But when you switch this on, you suddenly notice interesting side effects. The light comes on in the passenger co…

  • Technical article Board-EMC
  • Emission

• SA IHS, Experimental EMC In-house Seminar - Emission 3 days

  In the EMC in-house seminar on interference emission, we offer content customized to the requirements of your company.

• From Device Testing to the IC Test System

  Analyzing immunity at the IC level has the benefit of not requiring the impact of the device’s design on EMC to be considered. This includes, for example, the design of the printed circuit board, the nature and availability of the connector, or the housing construction. This article describes the co…

  • Technical article IC-EMC
  • Immunity

• SA-GE, Experimental EMC Seminar - Interference Emission - Basics and Troubleshooting (3 days)

  In this EMC emission training, you will learn practical methods for analyzing and optimizing the EMC performance of electronic circuits and devices. A key focus is on understanding how electromagnetic emissions are generated and how they can be effectively reduced. Using circuit models, the relatio…
  

Information

• Milestones

  Langer EMV-Technik GmbH develops measuring devices for accompanying EMV-analysis during the assembly development (PCB) and IC development (IC)

  • About us
  • Company
  • Milestones

• Trade Fair Participation

  Langer EMC-Technik GmbH participates globally in trade fairs and conferences

  • Trade Fair Participation

• Asia

  • About us
  • Distributors
  • Asia

• North America

  • About us
  • Distributors
  • North America

• E1 immunity development system

  • PCB Measurement Technology
  • E1 immunity development system

• Privacy policy

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• MP CI coupling inductance measurement station

  • Measuring and Calibration Stations
  • MP CI coupling inductance measurement station

• P700 RF voltage probe

  • P700 RF voltage probe

• P1202-2 set ESD magnetic field coupling

  • IC Measurement Technology
  • P1202-2 set ESD magnetic field coupling

• RF Injection – Practical Immunity Example – Review of EMV Cologne 2026

  • EMC Know-How
  • Newsletter
  • RF Injection – Practical Immunity Example – Review of EMV Cologne 2026

• 04 Radiated Emissions at the PCB Level - An Introduction

  Identifying EMI interference sources with near-field probes on the PCB

  • EMC Know-How
  • Newsletter
  • 04 Radiated Emissions at the PCB Level - An Introduction
  

• 06 Measuring the Shielding Effectiveness at IC Level with the IC Test System P1402/P1502

  Measuring the immunity and shielding effectiveness separately for the electric and magnetic field

  • EMC Know-How
  • Newsletter
  • 06 Measuring the Shielding Effectiveness at IC Level with the IC Test System P1402/P1502
  

• 07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction

  Using the IC measurement technology of the Langer EMV-Technik GmbH for precompliant testing of the electromagnetic compatibility of integrated circuits and allocation of the testing systems to the (international) standards.

  • EMC Know-How
  • Newsletter
  • 07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
  

• 08 ESD and Efficient Electronic Design

  This article focuses on the impact of IC behavior on electronic design, specifically ESD characteristics and how they influence a device by influencing its ICs.

  • EMC Know-How
  • Newsletter
  • 08 ESD and Efficient Electronic Design
  

• 09 Surface Scan on IC Level with high Resolution

  This article focuses on measurements with E-field and H-field microprobes.

  • EMC Know-How
  • Newsletter
  • 09 Surface Scan on IC Level with high Resolution
  

• 14 Mini Burst Field Generators in pocket size

  The P1 set with three mini burst field generators allows quick and flexible testing of the EMC immunity of assemblies. The handheld generators create burst or ESD-like interference fields, enabling the identification of weaknesses on PCBs and ICs. The separation of magnetic and electrical coupling helps to specifically test and optimize EMC countermeasures.

  • EMC Know-How
  • Newsletter
  • 14 Mini Burst Field Generators in pocket size
  

• 15 tent and GP 23 set

  The setup protects the oscilloscope during ESD measurements using a specially shielded tent. Measurement signals are routed into the tent via heavily shielded cables (e.g., semi-rigid). The oscilloscope is remotely controlled via a laptop, as the tent must remain closed during operation.

  • EMC Know-How
  • Newsletter
  • 15 tent and GP 23 set
  

• Measurement Technology for IC Security: Langer Near-Field Probes in Practical Use

  For side-channel analysis, near-field probes can be used to examine electromagnetic emissions in the near field.

  • EMC Know-How
  • Newsletter
  • Measurement Technology for IC Security: Langer Near-Field Probes in Practical Use
  

Categories

• Seminars

  Our EMC training courses provide engineers with practical, hands-on experience in electromagnetic compatibility (EMC). Unlike purely theoretical seminars, our courses focus on real-world measurements, troubleshooting, and practical solutions for EMC problems in electronic systems. Participants work directly with measurement equipment and realistic test setups to gain immediately applicable knowledge for their development projects. We offer specialized EMC training courses covering immunity and emission, each designed as a 3-day hands-on workshop with practical exercises.

  • Seminars

• PCB Immunity

  Measuring systems and EMC tools for accompanying immunity testing and analysis of assemblies and devices

  • Products
  • PCB Immunity
  

• Optical Signal Transmission

  Langer EMV-Technik GmbH`s optical signal transmission systems are used for a floating transmission of signals from the device under test to a distance of up to 20 m.

  • Products
  • PCB Immunity
  • Optical Signal Transmission
  

• Optical Signal Transmission

  Langer EMV-Technik GmbH`s optical signal transmission systems are used for the floating transmission of signals from the device under test up to a distance of 20 m.

  • Products
  • PCB Emission
  • Optical Signal Transmission
  

• Langer EMV-Technik in scientific research

  • EMC Know-How
  • Langer EMV-Technik in scientific research