XFS-R 3-1
Scanner Probe 30 MHz up to 6 GHz
Short description
The XFS-R 3-1 scanner probe is designed for direct high-resolution measurements of RF magnetic fields on an assembly, e.g. around the pins and IC cases, conducting paths, decoupling capacitor, and EMC components.
The XFS-R 3-1 H-field scanner probe is suitable for measurements close to the components with high magnetic field strength. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.
Technical parameters
| Frequency range | 30 MHz ... 6 GHz |
| Resolution | ≈ 1 mm |
| Probe head dimensions: | Ø ≈ 3 mm |
| Connector - output | SMA, male, jack |
| Frequency response [dBµV] / [dBµA/m] |
![Frequency response [dBµV] / [dBµA/m]](/fileadmin/Bilder300/Disturbance emission_near field probe_XFS-R 3-1_frequency response_en_wGM.png?v=1761830853767)
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| H-field correction curve [dBµA/m] / [dBµV] |
![H-field correction curve [dBµA/m] / [dBµV]](/fileadmin/Bilder300/Disturbance emission_near field probe_XFS-R 3_H-field correction curve_en_wGM.png?v=1761830853767)
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| Current correction curve [dBµA] / [dBµV] |
![Current correction curve [dBµA] / [dBµV]](/fileadmin/Bilder300/Disturbance emission_near field probe_XFS-R 3_current correction curve_en_wGM.png?v=1761830853767)
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| Measuring principles |
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