E2 set
TS 23 Immunity Development System
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E2 set - Scope of Delivery -
E2 set - Scope of Delivery with Product Designation
Short description
The E2 set is a system of EMC tools for pre-compliance immunity testing of assemblies and electronic devices. It is used for troubleshooting and vulnerability analysis of electronics across all system levels.
A key application is the analysis of electronic designs that have failed EMC immunity compliance tests and require redesign or optimization.
Another important use case is the pre-compliant testing during early development stages. This enables engineers to identify potential weaknesses early and significantly reduce the risk of failing formal EMC compliance tests.
The E2 set allows reproduction of typical failure modes observed in immunity testing, including fast transient disturbances (burst, IEC 61000-4-4) and electrostatic discharge (ESD, IEC 61000-4-2).
It enables engineers to determine both the coupling mechanism (magnetic field or electric field) and the exact location of the interference on the device under test (DUT). Design modifications can be immediately evaluated for effectiveness using the E2 Set.
The test set-up is compact and designed for use directly at the engineer’s workbench.
Scope of delivery
- 1x TS 23, Pulse Generator
- 1x GP 10, E2 set Ground Plate
- 1x MA 33-L, Magnetic Base Adapter for Resistive Coupling (left)
- 1x MA 33-R, Magnetic Base Adapter for Resistive Coupling (right)
- 1x DEA, Diff-to-Single-Ended Adapter
- 3x DE2, Differential Injector
- 3x DE6, Differential Injector
- 1x MS 101, Magnetic Field Probe
- 1x BS 02-h, Magnetic Field Source
- 1x BS 03-d, Magnetic Field Source
- 1x BS 04DB-d, Magnetic Field Source
- 1x BS 04DB-h2, Magnetic Field Source
- 1x BS 05DU-h2, Magnetic Field Source
- 1x ES 01-h, E-Field Source
- 1x ES 02-h, E-Field Source
- 1x ES 05D-h, E-Field Source
- 1x ES 08D-h, E-Field Source
- 1x ES 10D-h, E-Field Source
- 1x NT FRI EU 24V, Power Supply Unit
- 1x S21, Optical Sensor (10 Mbps)
- 1x LWL Ø 2.2 mm 1.5 m, Optical Fiber Single 1.5 m
- 1x E2 acc, Accessories
- 1x E2 case, System Case
- 1x E2 qg, TS 23 set Quick Guide
- 1x E2 m, E2 set User Manual
Technical parameters
| TS 23 Pulse Generator | |
| Pulse parameter | |
| Rise time | 1.5 ns |
| Max. Pulse voltage | 2.2 kV (adjustable) |
| Repetition frequency | 1.5 kHz (adjustable) |
| Polarity | +/- (adjustable) |
| Operating Modes | Continuous, Ramp, Pulse Groups, External Trigger |
| Optical input | |
| Optical fiber | 2.2 mm |
| Max. frequency | 5 MHz |
| Min. pulse width | 100 ns |
| Supply voltage | 24 V / 1 A DC |
| Sizes (L x W x H) | (160 x 200 x 75) mm |
| S21 optical sensor | |
| Transmission range | DC ... 10 Mbps |
| Optical fibre connector | 2.2 mm |
| Supply voltage | (3 - 5) V |
| Current input | 10 mA |
Scope of delivery details
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TS 23
Pulse Generator
The TS 23 is a generator for disturbing electronic devices with voltage pulses. The TS 23 has symmetrical and galvanically isolated outputs. The pulses generated by the disturbance generator are characterized by a rise time of 1.5 ns, a pulse width of 12 ns and a pulse voltage from 10 V up to 2.2 k…
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MS 101
Magnetic Field Probe
The MS 101 magnetic field probe detects the spartial distribution of magnetic fields. It is primarily used for cables, instrument housings or shielding shields. The magnetic field probe has an optical output and is operated in conjuction with SGZ 21 or TS 23. This is done by plugging in a fiber opt…
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BS 02-h
Magnetic Field Source
The BS 02-h magnetic field source is designed for identifying magnetic weak spots in PCB layouts. It generates a B-field of 5 cm in diameter which can be added to the housing surfaces, connectors, assemblies, and internal areas of the DUT to identify malfunctions.
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BS 03-d
Magnetic Field Source
The BS 03-d magnetic field source generates a high intensity magnetic field along a 16 mm linear wire. The probe can be placed directly on the IC to be tested. In this way, the IC's package is penetrated by a magnetic field that is similar to the fields generated during ESD tests. Due to the differe…
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BS 04DB-d
Magnetic Field Source
The BS 04DB-d magnetic field source generates a B-field in the millimeter range (Ø 4 mm). The field, which emerges from the probe's front side, is used to scan the surface of the PCB. This allows for the localization and identification of magnetic weak spots in the layout and component areas (wiring…
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BS 04DB-h2
Magnetic Field Source
The BS 04DB-h2 magnetic field source generates a B-field in the millimeter range (Ø 4 mm). The field, which emerges from the probe's front side, is used to scan the surface of the PCB. This allows for the localization and identification of magnetic weak spots in the layout and component areas (wirin…
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BS 05DU-h2
Magnetic Field Source
The BS 05DU-h2 generates a small scale magnetic field of a few millimeters at its tip. It functions like a coupling clamp and is used for selective coupling in single conducting paths, IC pins, components and fine cables (flat cables).
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ES 01-h
E-Field Source
With the ES 01-h E field source extensive electrical couplings are possible. The field source is suitable for pulsing weak spots from a range of 5 to 10 cm. Its radius of function is between that of the ES 02-h and ES 00-h field sources.
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ES 02-h
E-Field Source
The surface of the field source head allows for extensive coupling into housing surfaces, connectors, conducting path structures and ICs (e.g. bus systems, LC-displays). Its tip can also be used to localize smaller, E-field sensitive structures (conducting paths, quartz, pull-up resistors, ICs).
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ES 05D-h
E-Field Source
The ES 05D-h E-field source has a small decoupling electrode in its head. It can, therefore, be positioned onto conducting paths, small components and their connections, wires and single components. Single plugs or cable cores of flat cables can be tested.
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ES 08D-h
E-Field Source
The ES 08-h E field source is a test probe to determine the sensibility of an IC pin or a line. For measurements the probe must be in contact with a pin / conducting path and, because of its changing interference pulse intensities from the EFT/burst generator or TS 23 Pulse Generator, the sensitivit…
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ES 10D-h
E-Field Source
A linear coupling electrode with a width of 0.2 mm is integrated into the tip of the E-field source ES 10D-h. This makes the E-Field Source suitable for direct placement on very small structures on the PCB. For example, 0.1 mm wide traces or individual IC pins on high-pin-count ICs can be examined.
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S21
Optical Sensor (10 Mbps)
The S21 sensor is a digital probe for nonreactive transmissions of binary signals out of the device under test during a burst or ESD testing. The sensor is positioned directly onto the PC board of the device under test and is powered by the device under test. In the sensor the digital signal is tran…
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LWL Ø 2.2 mm 1.5 m
Optical Fiber Single 1.5 m
The optical fiber LWL Ø 2.2mm 1.5 m is a single channel flexiable fiber cable for optical signal transmission.