The ESA1 is a system of EMC tools for measuring the interference of assemblies and devices. The CS-ESA software allows the developer to quickly and comprehensively suppress interference affecting the DUT. Interference measurements taken during the development stage with ESA1 are proportional to the results from far-field measurements or from measurements with artificial networks. With the ESA1 tools disturbance sources can be localized, effects can be detected, and EMC measures individually determined. The effects of improvements implemented by ESA1 are proportional to the results from far-field measurements. ESA1 is designed for use at the developer's working place.
Scope of delivery
- 1x CS-ESA set, ChipScan-ESA Software / USB
- 1x HFW 21, RF Current Transformer
- 1x HFA 21, RF Bypass
- 1x Z23-1 set, Shielding Tent (900 x 500x 400) mm
- 1x PA 203 BNC, Preamplifier 100 kHz up to 3 GHz
- 1x RF-B 0.3-3, H-Field Probe mini 30 MHz up to 3 GHz
- 1x RF-B 3-2, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-E 02, E-Field Probe 30 MHz up to 1.5 GHz
- 1x RF-E 05, E-Field Probe 30 MHz up to 3 GHz
- 1x RF-E 10, E-Field Probe 30 MHz up to 3 GHz
- 1x RF-R 0.3-3, H-Field Probe mini 30 MHz up to 3 GHz
- 1x RF-R 3-2, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-R 50-1, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-R 400-1, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-U 2.5-2, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-U 5-2, H-Field Probe 30 MHz up to 3 GHz
- 1x ESA1 acc, Accessories
- 1x ESA1 case, System case
- 1x ESA1 m, ESA1 Set User Manual
Scope of delivery details
ChipScan-ESA is a software designed to control a spectrum analyzer remotely. The measurement curves are saved and logged in the software. The user can then combine saved curves with other saved curves, correction curves, frequency-dependant functions (curves), or constants into a single curve. Any n…
The RF current transformer measures high-frequency currents within the device under test. It discharges the currents on the ground plane and allows for the separate measurements of common-mode current and differential-mode current. This can be helpful for the improvement of switching-power supplies.…
The Z23-1 shielding tent consits of a frame with a shielding cover and the GP 23 ground plate. It allows for shielding of the measurement set-up against external RF fields or for shielding the measuring devices, e.g. during ESD tests. From the front, the tent can be easily and quickly opened or clos…
The PA 203 preamplifier is designed for the amplification of measuring signals, e.g. weak signals of high-resolution near-field probes. The input and the output of PA 203 are implemented as either 50 ohm BNC (PA 203 BNC) or SMA connector (PA 203 SMA).
The H-field probe RF-B 0.3-3 is designed for extreme small-scale detection of magnetic field lines entering at 90° angles into the probe tip. The coil inside the probe head is positioned at a 90° angle from the shaft. For measurements it can be positioned directly onto the measured object.
The measurement coil of the RF-B 3-2 H-field probe is set at a 90° angle to the probe shaft. By positioning the probe head vertically, the measurement coil touches the surface of the printed circuit board directly. This allows for use at places on the surface of printed circuit boards, which are typ…
The RF-E 02 near-field probe detects electrical fields that are decoupled from bus structures, larger components or supply surfaces. The electrode surface on the underside of the probe tip is approx. 2 cm x 5 cm. The probe functions best within distances of 1 cm - 2 cm from the component.
The electrode at the underside of the probe head of the RF-E 05 has a width of approx. 0.5 mm. The E-fields of clocked lines, IC pins, and smaller components are precisely located.
The electrode underneath the RF-E 10 probe has a width of approx. 0.2 mm, which can locate even the smallest E-field sources, e.g. conducting paths with a width of 0.1 mm or, single IC pins at high pin ICs.
With its small probe head, the RF-R 0.3-3 can measure magnetic fields in very high resolution. Thus even smallest components can be detected as interference sources. Furthermore, the small probe head is suitable for measurements at hard to reach spots, e.g. near IC pins.
The RF-R 3-2 near-field probe is used for the high-resolution measurement of RF magnetic fields directly on an assembly e.g. in range around pins and IC cases, conducting paths, decoupling capacitor and EMC components.
The RF-R 50-1 H-field probe is designed for measurements at assemblies, devices, or cables at distances up to approx. 3 cm. The H-field probe can identify larger components as interference sources.
Due to its large diameter (25 mm) the RF-R 400-1 H-field probe is highly sensitive and is suitable for measurements at distances up to 10 cm around assemblies and devices.
The RF-U 2.5-2 near-field probe is designed for the selective measurements of RF currents in conducting paths, component connectors, SMD components, and IC-pins. The probe head has a magnetically active gap with an approx. width of 0.5 mm. To use, the head should be positioned directly onto the meas…
The RF-U 5-2 H-field probe is designed for detecting magnetical fields at broad conducting paths, cables, connectors, electronic components and their connections. The probe functions like a coupling clamp.
The ESA1 accessories are necessary for the use of the ESA1 set. Among others the following parts are included: laboratory cable, measurement cable, measurement lines, connecting terminals, a foam block, a DC cable, and a plug-in power supply.
The ESA1 is a system of EMC tools for the comparative measurement of interference emitted by assemblies and devices. The CS-ESA software, which is designed for the developer's needs, is included for quick and easy-to-follow interference supression. ESA1 is designed for the developer's work space. Wi…