Positioning systems (scanner) for all Langer Near-Field Probes, Langer Injection Probes (ICI) and Near-Field Micro Probes (ICR).
Select from various positioning systems for automated PCB and IC scans with high-resolution measuring systems.
Accessories for Langer Scanner
Near-field Scanner Probes
Passive near-field probes designed for the use in a scanner to measure E-field and magnetic field during development.