IC Security – Side-Channel Analysis and EM Fault Injection – Equipment from Langer EMV-Technik GmbH
In addition to our solutions for EMC analysis and optimization at PCB and IC level, Langer EMV-Technik GmbH also offers specialized equipment for IC Security. This includes products for Side-Channel Analysis (SCA) as well as Electromagnetic Fault Injection (EMFI).
Near-Field Probes for Side-Channel Analysis
Depending on the measurement task, near-field probes or high-resolution ICR near-field microprobes from Langer EMV-Technik GmbH can be used to capture electromagnetic signals for side-channel analysis.
The near-field probes are available in a wide range of designs, probe sizes, and frequency ranges, allowing a suitable probe to be selected for the specific application. For measurements up to 3 GHz, for example, the RF-B 3-2 (see Figure 1) is a suitable choice, while the RF-B 0.3-3 offers higher spatial resolution. Due to the horizontal orientation of the measurement coil, these probes can easily be positioned vertically above the IC.
For measurements requiring particularly high spatial resolution, for example directly at the IC, a wide range of ICR near-field microprobes is available. Depending on the required frequency range and spatial resolution, magnetic and electric near fields can be measured separately with a spatial resolution down to 60 µm and at frequencies of up to 6 GHz. A detailed overview is shown in the following figures. ICR near-field microprobes for H-field measurements are also available with vertically or horizontally oriented probe tips. In addition, all ICR near-field microprobes feature an integrated preamplifier.
ICR Near-Field Microprobes for H-Field Measurements
ICR Near-Field Microprobes for E-Field Measurements
ICI and ICI-DP Sets for Electromagnetic Fault Injection (EMFI)
For EMFI applications, Langer EMV-Technik GmbH offers systems based on ICI and ICI-DP probes. Together with the appropriate high-voltage supply (BPS 202 or BPS 204), the probes enable the local injection of fast magnetic field pulses into integrated cryptographic circuits, depending on the probe type. Probes for injecting current pulses (Body Bias Injection – BBI) or electric fields are also available.
The ICI series enables the injection of single disturbance pulses with a maximum generator voltage of 500 V. The ICI-DP series additionally enables the injection of defined double pulses with a variable time interval down to 25 ns and operates with voltages of up to 1000 V. Depending on the required spatial resolution and disturbance power, different probes with tip coil diameters ranging from 150 µm to 1000 µm are available, allowing the setup to be adapted to different test requirements. For both the ICI and ICI-DP series, additional parameters such as pulse polarity and trigger options can be controlled via software.
Precise Positioning with the ICS 105 basic set
For reproducible and automated workflows, particularly when using high-resolution ICR near-field microprobes or ICI(-DP) probes, the ICS 105 Basic Set is recommended.
The ICS 105 positioning system enables the probes to be moved along the x, y, and z axes and additionally rotated around the z axis. This allows defined positions to be approached precisely and measurements to be repeated under comparable conditions.
In combination with a probe, the positioning system enables heat maps to be generated and further analyses to be carried out at defined positions.
