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产品
印刷电路板的抗干扰性
抗干扰开发系统
用于开发过程的发生器
配件（猝发 / 电快速瞬变脉冲发生器 IEC 61000-4-4）
光信号传输
猝发脉冲序列探测器
印刷电路板的干扰发射
用于开发过程的测试技术
近场探头
前置放大器
Near-Field Microprobes
光信号传输
集成电路测试技术
集成电路的测试环境
干扰发射
集成电路的抗干扰性
IC Security
Fault Injection
Positioning systems
扫描仪
Langer 扫描仪
Accessories for Langer Scanner
Near-field Scanner Probes
软件
CS-Scanner, ChipScan-Scanner 软件
CS-ESA set, ESA芯片扫描软件
测试及校准工作台
印刷电路板
集成电路
连接器
测试技术的学习和培训
EMC-Basic 1 set
EMC-Basic 2 set
DB 20 set
D10 set
研讨班
SF-GE
SA-GE, SA-GE
SF IHS
SA IHS
Dates Overview
服务
电磁兼容性讲座
集成电路的电磁兼容性干扰发射分析
集成电路的电磁兼容性抗干扰分析
SDM Langer
COCI
EMV-B, 咨询 / 电子干扰排除
电磁兼容性知识
专业文献：Board-EMC
集成电路的电磁兼容性抗干扰分析
集成电路的电磁兼容性干扰发射分析
专业文献： IC-EMC
集成电路的电磁兼容性抗干扰分析
集成电路的电磁兼容性干扰发射分析
Langer EMV-Technik in scientific research
资讯
Shielding Measurement System
IC EMC Parameters - Mechanisms of Interference Emission
Measurement Technology for IC Security: Langer Near-Field Probes in Practical Use
17 ESA1 set
16 ICI-DP sets
RF Injection – Practical Immunity Example – Review of EMV Cologne 2026
15 tent and GP 23 set
14 Mini Burst Field Generators in pocket size
13 Achieve interference immunity by identifying and eliminating EMC weak points:
12 ICR: Near-field analysis in the micrometer range and its advantages
11 ChipSan-ESA now supports more measuring devices
10 P512 and DPI
09Surface Scan on IC Level with high Resolution
08 ESD and Efficient Electronic Design
07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
06 Measuring the Shielding Effectiveness at IC Level with the IC Test System P1402/P1502
05 Time and cost savings when recording and documenting RF measurements with a spectrum analyzer
04 Radiated Emissions at the PCB Level - An Introduction
03 消除脉宽调制 (PWM) 直流电机的电磁骚扰
使用朗格尔(Langer EMV-Technik GmbH)近场探头实现至6 GHz的测量
01 EMC实用技巧和建议 如何使用近场探头抑制LVDS连接的干扰
视频
产品用途
研讨会
Near-Field Microprobes
Near-Field Microprobes
