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  • About us
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  • Products
    • PCB Immunity
      • Immunity Development System
      • Mini Burst Field Generators
      • Accessory EFT/Burst generators IEC 61000-4-4
      • Optical Signal Transmission
      • Burstdetector
    • PCB Emission
      • Measurement Technology for the Development Stage
      • Near-Field Probes
      • Preamplifier
      • Near-Field Microprobes
      • Optical Signal Transmission
    • IC Test System
      • IC Test Environment
      • Emission
      • Immunity
      • Simulation
    • IC Security
      • Fault Injection
      • Side-channel analysis
      • Positioning systems
    • Positioning Systems
      • Langer Scanner
      • Accessories for Langer Scanner
      • Near-field Scanner Probes
    • Software
      • CS-Scanner, ChipScan-Scanner Software / USB
      • CS-ESA set, ChipScan-ESA Software / USB
    • Measuring and Calibration Stations
      • PCB
      • IC
      • Connector
    • Equipment for Teaching and Training
      • EMC-Basic 1 set, Demonstration Boards Mini Burst Field Generators
      • EMC-Basic 2 set, Demonstration Boards Near-Field Probes
      • DB 20 set, Demo Board 20
      • D10 set, EMC Demonstration Board
  • Seminars
    • SF-GE, Experimental EMC Seminar - Interference Immunity - Basics & Troubleshooting (3 days)
    • SF-G, EMC Experimental Seminar - Interference Immunity-Basics (2 days)
    • SA-GE, Experimental EMC Seminar - Interference Emission - Basics and Troubleshooting (3 days)
    • SA-G, EMC Experimental Seminar - Interference Emission - Basics (2 days)
    • SF IHS, Experimental EMC Inhouse Seminar - Interference Immunity 3 days
    • SA IHS, Experimental EMC Inhouse Seminar - Emission 2 days
    • Dates Overview
  • Services
    • EMC Workshops
      • WS ESA1, Workshop for Development System Emission
      • WS IC, EMC Workshop for Integrated Circuits
      • WS PCB, EMC-Workshop for Immunity and Emission
      • WS Scanner, Workshop for Langer Scanner
    • IC-EMC Analysis
      • Emission
      • Immunity
    • EMC Analysis
      • SMM Langer, Measuring of electromagnetic Shielding according to Langer method
      • COCI, Measurement of the Coupling Inductance of Connectors and Cables
    • EMV-B, EMC-Consulting / Hour
  • EMC Know-How
    • Technical article Board-EMC
      • Basic Knowledge
      • Immunity
      • Emission
    • Technical article IC-EMC
      • Basic Knowledge
      • Immunity
      • Emission
    • Langer EMV-Technik in scientific research
    • Newsletter
      • 17 ESA1 set
      • 16 ICI-DP sets
      • 15 tent and GP 23 set
      • 14 Mini Burst Field Generators in pocket size
      • 13 Achieve interference immunity by identifying and eliminating EMC weak points:
      • 12 ICR: Near-field analysis in the micrometer range and its advantages
      • 11 ChipSan-ESA now supports more measuring devices
      • 10 P512 and DPI
      • 09 Surface Scan on IC Level with high Resolution
      • 08 ESD and Efficient Electronic Design
      • 07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
      • 06 Measuring the Shielding Effectiveness at IC Level with the IC Test System P1402/P1502
      • 05 Time and cost savings when recording and documenting RF measurements with a spectrum analyzer
      • 04 Radiated Emissions at the PCB Level - An Introduction
      • 03 Interference suppression on a direct-current motor controlled by PWM
      • 02 XF sniffer probes and LVDS suppression
      • 01 MFA micro probes and LVDS suppression
    • Videos
      • How-to videos
      • EMC Webinar
  • EMC Workshops
    • WS ESA1Workshop for Development System Emission
    • WS ICEMC Workshop for Integrated Circuits
    • WS PCBEMC-Workshop for Immunity and Emission
    • WS ScannerWorkshop for Langer Scanner
  • IC-EMC Analysis
  • EMC Analysis
  • EMV-BEMC-Consulting / Hour
  • Services
  • EMC Workshops
  • WS Scanner, Workshop for Langer Scanner

WS Scanner

Workshop for Langer Scanner

  • Short description
Send enquiry Datasheet
  • WS Scanner, Workshop for Langer Scanner
WS Scanner, Workshop for Langer Scanner
Short description

Langer EMV-Technik GmbH offers a workshop for the handling of Langer scanners. Our development engineer will explain to you the construction and commissioning of a Langer scanner, the installation and operation of the software and the execution of a scan. Afterwards you will perform a test scan together. Following this, you will scan a DUT (or your own if previously agreed upon) with the help of our development engineer and learn how to evaluate the scan.

We will be happy to conduct the workshop on your premises. Please contact us.

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